Influence of contact geometry and current on effective erosion of Cu-Cr, Ag-WC, and Ag-Cr vacuum contact materials

IEEE Transactions on Components and Packaging Technologies

Volumn 22, Issue 3, 1999, Pages 405-413

  Schulman, Michael Bruce ^a,b   Slade, Paul G ^a,c   Loud, Leslie D ^c   Li, Wangpei ^c  

^a IEEE

^b Cutler Hammer   (United States)

^c EATON CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CATHODES; COPPER ALLOYS; EROSION; SILVER ALLOYS; VACUUM TECHNOLOGY;

COPPER CHROMIDE; SILVER CHROMIDE; SILVER TUNGSTEN CARBIDE; VACUUM CONTACTORS;

ELECTRIC CONTACTORS;

EID: 0033316493     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/6144.796543     Document Type: Article

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