Dynamic force microscopy investigations of C60 deposited on Si(111) surface

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 38, Issue 12 B, 1999, Pages

  Kobayashi, Kei ^a   Yamada, Hirofumi ^a   Horiuchi, Toshihisa ^a   Matsushige, Kazumi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; MOLECULAR STRUCTURE; MULTILAYERS; SILICON WAFERS; SURFACE PHENOMENA; SURFACE STRUCTURE; THIN FILMS;

DYNAMIC FORCE MICROSCOPY; SURFACE RECONSTRUCTION;

FULLERENES;

EID: 0033316410     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.l1550     Document Type: Article

References (11)