Comparison of visible and infrared backscattering Mueller matrices from roughened aluminium surfaces

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3754, Issue , 1999, Pages 266-276

  Lewis, G D ^a   Jordan, D L ^a   Niven, S D ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED IMAGING; LIGHT SCATTERING; MATHEMATICAL MODELS; OPTICAL VARIABLES MEASUREMENT; REMOTE SENSING; SURFACE ROUGHNESS;

MICROWAVE SEA ECHO; MUELLER MATRIX; PROFILOMETER; STOKES PARAMETERS;

BACKSCATTERING;

EID: 0033315285     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)