Self-heating characterization for SOI MOSFET based on AC output conductance

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1999, Pages 175-178

  Jin, Wei ^a   Fung, Samuel K H ^a   Liu, Weidong ^a   Chan, Philip C H ^a   Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTANCE; EQUIVALENT CIRCUITS; FREQUENCIES; HEAT RESISTANCE; SILICON ON INSULATOR TECHNOLOGY; THERMAL EFFECTS;

AC DRAIN OUTPUT CONDUCTANCE; SELF HEATING EFFECT; SOFTWARE PACKAGE MEDICI; THERMAL CAPACITANCE; THERMAL TIME CONSTANT;

MOSFET DEVICES;

EID: 0033314624     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)