Fast X-ray Measurement System for Structural Study in ZrAluNi Supercooled Liquid

Materials Research Society Symposium - Proceedings

Volumn 554, Issue , 1999, Pages 101-106

  Sato, S ^a,b,c,d   Matsubara, E ^a,b,c,d   Waseda, Y ^a,b,c,d   Zhang, T ^a,b,c,d   Inoue, A ^a,b,c,d  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; GLASS TRANSITION; LIQUID METALS; MOLECULAR STRUCTURE; TERNARY SYSTEMS; X RAY SCATTERING; ZIRCONIUM ALLOYS;

ANOMALOUS X-RAY SCATTERING (AXS); FAST X-RAY MEASUREMENT SYSTEM;

METALLIC GLASS;

EID: 0033314581     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

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