Use of COTS microelectronics in radiation environments

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1494-1503

  Winokur, P S ^a   Lum, G K ^a   Shaneyfelt, M R ^a   Sexton, F W ^a   Hash, G L ^a   Scott, L ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMMERCIALLY AVAILABLE OFF THE SHELF; STATIC RANDOM ACCESS MEMORY;

CMOS INTEGRATED CIRCUITS; DOSIMETRY; IONIZING RADIATION; MICROELECTRONICS; RANDOM ACCESS STORAGE;

RADIATION HARDENING;

EID: 0033314067     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819113     Document Type: Article

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