Components testing for HESSI satellite aspects modules

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1999, Pages 92-95

  Hajdas, Wojtek ^a   Bialkowski, Jacek ^a   Fivian, Martin ^a   Henneck, Reinhold ^a   Mchedlishvili, Aliko ^a   Sturcke, Erik ^a   Thomsen, Knud ^a   Zehnder, Alex ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CHARGE COUPLED DEVICES; DIGITAL SIGNAL PROCESSING; IMAGE SENSORS; RADIATION EFFECTS; RADIATION HARDENING; SATELLITES; SPECTROSCOPY;

SINGLE EVENT PHENOMENA; TOTAL DOSE RADIATION HARDNESS;

INTEGRATED CIRCUIT TESTING;

EID: 0033313837     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (3)