메뉴 건너뛰기




Volumn 273-274, Issue , 1999, Pages 934-937

Do structural defects affect semiconducting properties of fullerene thin films?

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRON SPIN RESONANCE SPECTROSCOPY; FULLERENES; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; INTERDIFFUSION (SOLIDS); SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR GROWTH; THIN FILMS;

EID: 0033313811     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00558-X     Document Type: Article
Times cited : (10)

References (19)
  • 18
    • 33847555460 scopus 로고    scopus 로고
    • US Patent No. 5,876,790, Ormat Industries Ltd., Israel
    • E.A. Katz, US Patent No. 5,876,790, Ormat Industries Ltd., Israel, 1999.
    • (1999)
    • Katz, E.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.