Dynamic range of optical reflectometry with spectral interferometry

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 10, 1999, Pages 6133-6137

  Mitsui, Takahisa ^a  

^a KEIO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIODES; INTERFEROMETRY; LUMINESCENT DEVICES; NONINVASIVE MEDICAL PROCEDURES; REFLECTOMETERS; SCANNING; TOMOGRAPHY;

OPTICAL COHERENCE TOMOGRAPHY; OPTICAL REFLECTOMETRY; SPECTRAL INTERFEROMETRY; SUPERLUMINESCENT DIODES;

OPTICAL VARIABLES MEASUREMENT;

EID: 0033313472     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.6133     Document Type: Article

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