Study of non-linearities in photodiodes using electrical auto-correlation

Physica B: Condensed Matter

Volumn 272, Issue 1-4, 1999, Pages 495-498

  Vickers, Anthony J ^a   Ucgun, Ercan ^a   Mazzucato, Simone ^a  

^a UNIVERSITY OF ESSEX   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ELECTRIC CURRENT MEASUREMENT; ELECTROOPTICAL EFFECTS; IMPACT IONIZATION; NONLINEAR OPTICS; SEMICONDUCTOR LASERS; ULTRAFAST PHENOMENA;

ELECTRICAL AUTO-CORRELATION;

PHOTODIODES;

EID: 0033313280     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00362-2     Document Type: Article

References (11)

1. Vickers A.J.et al. J. Opt. Quantum Electron. 28:1996;983.
2. Shimizu M.et al. Opt. Rev. 2:1995;401.
3. Shimizu M.et al. Jpn. J. Appl. Phys. 37:1998;L1040.
4. Shimizu M. Jpn. J. Appl. Phys. 35:1996;L1191.
5. Ozbay E.et al. Appl. Phys. Lett. 74:1999;1072.
6. Smith F.W.et al. Appl. Phys. Lett. 54:1989;890.
7. J.A. Valdmanis, Semiconductors and Semimetals, vol. 28, 1990 (Chapter 4), Academic Press, San Diego, CA, 1994.
8. Weiesenfield J. IBM J. Res. Dev. 34:1990;141.
9. Carruthers T.F., Weller J.F. Appl. Phys. Lett. 48:1986;460.
10. Vickers A.J.et al. Proc. SPIE. 3625:1999;240.
11. Dudley R.A., Vickers A.J. Hess K. Hot Carriers in Semiconductors. 1996;361 Plenum, New York.