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Volumn 1, Issue , 1999, Pages 188-191
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Novel beam line for sub-keV implants with reduced energy contamination
a a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CURRENTS;
ION BEAMS;
MAGNETS;
HIGH CURRENT ION IMPLANTATION SYSTEMS;
ION IMPLANTATION;
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EID: 0033312486
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (7)
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