Characteristic of Super-RENS disks with various thickness of thermal protective layers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3864, Issue , 1999, Pages 157-159

  Sato, Akira ^a   Tominaga, Junji ^a   Nakano, Takashi ^a   Fuji, Hiroshi ^a   Atoda, Nobufumi ^a  

^a Konica Corporation   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC WAVE DIFFRACTION; FINITE DIFFERENCE METHOD; LASER RECORDING; LIGHT REFLECTION; MASKS; MATHEMATICAL MODELS; PROTECTIVE COATINGS; SPURIOUS SIGNAL NOISE; SUBSTRATES; TIME DOMAIN ANALYSIS; VIDEODISKS;

CARRIER TO NOISE RATIOS (CNR); FRAUNHOFER APPROXIMATIONS; SUPER-RESOLUTION NEAR-FIELD STRUCTURE (SUPER-RENS) SYSTEMS; THERMAL PROTECTIVE LAYERS;

OPTICAL DISK STORAGE;

EID: 0033312407     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)