Optimum near-far resistance for dual-rate DS/CDMA signals: Random signature sequence analysis

IEEE Transactions on Information Theory

Volumn 45, Issue 7, 1999, Pages 2434-2447

  Chen, Jiangxin ^b   Mitra, Urbashi ^a,c  

^a IEEE   (United States)

^b QUALCOMM INC   (United States)

^c Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MULTICODE (MC) ACCESS; NEAR-FAR RESISTANCE; RANDOM SIGNATURE SEQUENCES; VARIABLE SPREADING LENGTH (VSL);

CODE DIVISION MULTIPLE ACCESS; CODES (SYMBOLS); RANDOM PROCESSES;

DIRECT SEQUENCE SYSTEMS;

EID: 0033311243     PISSN: 00189448     EISSN: None     Source Type: Journal    
DOI: 10.1109/18.796382     Document Type: Article

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