X-ray photoelectron spectroscopy: a powerful tool for a better characterization of thin film materials

Bulletin of Materials Science

Volumn 22, Issue 3, 1999, Pages 607-614

  Levasseur, A ^a   Vinatier, P ^a   Gonbeau, D ^b  

^a Ecole Nationale Superieure de Chimie et de Physique de Bordeaux   (France)

^b LPCM   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CHEMICAL ELEMENTS; ELECTRODES; LITHIUM COMPOUNDS; MINIATURE BATTERIES; MOLYBDENUM COMPOUNDS; REDOX REACTIONS; TITANIUM; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC ENVIRONMENTS; LITHIUM COBALT OXIDE; MICROBATTERY; MOLYBDENUM OXYSULFIDE; OXYDO REDUCTION MECHANISMS; TITANIUM OXYSULFIDE;

THIN FILMS;

EID: 0033311215     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02749975     Document Type: Article

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