X- and gamma-ray hardness of floating-gate EEPROM technology as applied to implantable medical devices

IEEE Transactions on Components and Packaging Technologies

Volumn 22, Issue 3, 1999, Pages 390-398

  Prutchi, David ^a,b   Prince, John L ^a,c   Stotts, Lawrence J ^a,d  

^a IEEE

^b Impulse Dynamics   (United States)

^c University of Arizona   (United States)

^d Intermedics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GAMMA RAYS; IMPLANTS (SURGICAL); NONVOLATILE STORAGE; RADIATION EFFECTS; RADIATION HARDENING; X RAYS;

ELECTRICALLY ERASABLE AND PROGRAMMABLE READ-ONLY MEMORY (EEPROM); IMPLANTABLE BIOMEDICAL DEVICES;

ROM;

EID: 0033311125     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/6144.796541     Document Type: Article

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