Radiation effects in a fixed-point digital signal processor

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1999, Pages 30-34

  Crain, S H ^a   Velazco, R ^a   Alvarez, M T ^a   Bofill, A ^a   Yu, P ^a   Koga, R ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL SIGNAL PROCESSING; DOSIMETRY; ELECTRIC CURRENTS; INTEGRATED CIRCUIT TESTING; IONIZING RADIATION; MICROPROCESSOR CHIPS;

SINGLE EVENT EFFECT; SINGLE EVENT LATCHUP;

RADIATION EFFECTS;

EID: 0033310758     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)