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Volumn 1, Issue , 1999, Pages 543-548
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HPM effects on electronic components and the importance of this knowledge in evaluation of system susceptibility
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Author keywords
[No Author keywords available]
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Indexed keywords
DIGITAL CIRCUITS;
ELECTRIC CABLES;
ELECTRIC SHIELDING;
MICROWAVES;
DEVICE UNDER TEST;
SYSTEM SUSCEPTIBILITY;
ELECTRONIC EQUIPMENT TESTING;
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EID: 0033310418
PISSN: 01901494
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (18)
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References (5)
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