High speed digital transceivers: a challenge for manufacturing

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 211-215

  Cole, Clifford B ^a   Warwick, Thomas Phillip ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; AUTOMATIC TESTING; BIPOLAR INTEGRATED CIRCUITS; BUFFER CIRCUITS; BUILT-IN SELF TEST; CMOS INTEGRATED CIRCUITS; DATA COMMUNICATION SYSTEMS; PHASE LOCKED LOOPS; TRANSCEIVERS;

AUTOMATIC TESTING EQUIPMENT; GIGABIT TRANSCEIVER MACROCELLS; LOW VOLTAGE DIFFERENTIAL SWING;

DESIGN FOR TESTABILITY;

EID: 0033309981     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)