Structure evolution in Ag/Ni multilayers grown by ultra high vacuum DC magnetron sputtering

Thin Solid Films

Volumn 353, Issue 1, 1999, Pages 166-173

  Sandstrom P ^a   Svedberg, E B ^a   Johansson, M P ^a   Birch, J ^a   Sundgren, J E ^b  

^a LINKÖPING UNIVERSITY   (Sweden)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ARGON; ATOMIC FORCE MICROSCOPY; FILM GROWTH; MAGNETRON SPUTTERING; NICKEL; SEMICONDUCTING SILICON; SILVER; SURFACE ROUGHNESS; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ADATOM MOBILITY; CRYSTALLINITY; GIANT MAGNETORESISTANCE; STRUCTURE EVOLUTION;

MULTILAYERS;

EID: 0033309794     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00426-5     Document Type: Article

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