ESPI with holographically stored waves and other innovative ESPI methods used for real-time monitoring of dynamic thermal deformations in a practical industrial environment

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3824, Issue , 1999, Pages 262-273

  Petrov, Valery ^a   Lau, Bernhard ^a  

^a ULM UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CCD CAMERAS; DAMAGE DETECTION; DEFORMATION; DYNAMICS; OPTICAL DATA PROCESSING; OPTICAL TESTING; PRINTED CIRCUITS; SPECKLE; STRESSES; COMPUTER SIMULATION; ELECTRIC HEATING; HOLOGRAPHIC OPTICAL ELEMENTS; MICROELECTRONICS; MIRRORS; NONDESTRUCTIVE EXAMINATION; PRINTED CIRCUIT BOARDS; QUALITY CONTROL;

ACQUISITION AND DOCUMENTATIONS; ELECTRONIC COMPONENT; ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; ENVIRONMENTAL VIBRATIONS; INDUSTRIAL ENVIRONMENTS; OPTOELECTRONIC METHOD; PRINTED CIRCUIT BOARDS (PCB); REAL TIME MONITORING;

PRINTED CIRCUIT BOARDS; HOLOGRAPHIC INTERFEROMETRY;

ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; HOLOGRAPHICALLY STORED WAVES; LASER METROLOGY; MICROSTRUCTURED REFRACTIVE OPTICAL ELEMENTS;

EID: 0033309482     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.364277     Document Type: Conference Paper

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