Automatic measurement equipment for quality control in the loop slitting department

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3897, Issue , 1999, Pages 328-334

  Hussmann, Stephan ^a   Kleuver, Wolfram ^a   Guenther, Bernd ^a   Groeneweller, Joerg ^a   Rath, Holger ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; CHARGE COUPLED DEVICES; DIGITAL SIGNAL PROCESSING; FIELD PROGRAMMABLE GATE ARRAYS; LIGHT EMITTING DIODES; MICROCONTROLLERS; MULTIPLEXING EQUIPMENT; OPTICAL DESIGN; QUALITY CONTROL; THICKNESS MEASUREMENT;

CHARGE COUPLED DEVICE (CCD) SENSORS;

OPTICAL SENSORS;

EID: 0033308703     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)