Superpolishing and precision metrology on a metal mandrel and replicated segments for Constellation-X

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3766, Issue , 1999, Pages 22-33

  Content, D ^a   Saha, T ^a   Petre, R ^a   Lyons III, J J ^a   Wright, G ^a   Zaniewski, J ^a   Chan, K W ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MATHEMATICAL MODELS; OPTICAL TELESCOPES; OPTICS; SURFACE ROUGHNESS; X RAYS;

CONSTELLATION-X; POWER SPECTRAL DENSITY; PRECISION METROLOGY; SUPERPOLISHING;

MIRRORS;

EID: 0033308284     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)