Long trace profiler survey results

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3782, Issue , 1999, Pages 275-282

  Irick, Steve ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASPHERICS; MIRRORS; OPTICAL VARIABLES MEASUREMENT; PERFORMANCE; X RAY APPARATUS;

HIGH CURVATURE ASPHERES; LONG TRACE PROFILER; MIRROR MEASUREMENT; X RAY MIRRORS;

OPTICAL INSTRUMENTS;

EID: 0033308249     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)