Advanced x-ray systems for nondestructive inspection and contraband detection

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3769, Issue , 1999, Pages 98-105

  Armistead, Robert A ^a  

^a Advanced Research & Applications Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTERIZED TOMOGRAPHY; IMAGING SYSTEMS; INSPECTION; RAPID PROTOTYPING; REVERSE ENGINEERING; X RAYS;

PENETRATING RADIATION; X RAY IMAGING SYSTEMS;

NONDESTRUCTIVE EXAMINATION;

EID: 0033308051     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)