Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 1152-1161

  Nigh, Phil ^a   Vallett, Dave ^a   Patel, Atul ^a   Wright, Jason ^a   Motika, Franco ^a   Forlenza, Donato ^a   Kurtulik, Ray ^a   Chong, Wendy ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENTS; FAILURE ANALYSIS; MATHEMATICAL MODELS; PROBABILITY; RELIABILITY;

FAULT DIAGNOSIS; SEMATECH TEST METHOD;

INTEGRATED CIRCUIT TESTING;

EID: 0033307886     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)