Stability and phase noise tests of two cryo-cooled sapphire oscillators

Proceedings of the Annual IEEE International Frequency Control Symposium

Volumn 2, Issue , 1999, Pages 548-551

  Dick, G John ^a   Wang, Rabi T ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENIC EQUIPMENT; MASERS; SIGNAL RECEIVERS;

ALLAN DEVIATION MEASUREMENTS; COMPENSATED SAPPHIRE OSCILLATORS (CSO); PHASE NOISE TESTING;

MICROWAVE OSCILLATORS;

EID: 0033307652     PISSN: 01616404     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)