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Volumn , Issue , 1999, Pages 363-366
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Single electron and few electron memory cells
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
GATES (TRANSISTOR);
LOW TEMPERATURE OPERATIONS;
MOSFET DEVICES;
SCANNING ELECTRON MICROSCOPY;
SILICON ON INSULATOR TECHNOLOGY;
TUNNEL JUNCTIONS;
MULTIPLE TUNNEL JUNCTION;
PHASE STATE LOW ELECTRON NUMBER DRIVE MEMORY;
SINGLE ELECTRON MEMORIES;
SINGLE ELECTRON TRANSISTORS;
TRANSISTORS;
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EID: 0033307579
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (7)
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References (8)
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