Comparison of a two-stage group-screening design to a standard 2k-p design for a whole-line semiconductor manufacturing simulation model

Winter Simulation Conference Proceedings

Volumn 1, Issue , 1999, Pages 640-646

  Ivanova, Theodora ^a   Malone, Linda ^a   Mollaghasemi, Mansooreh ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER SIMULATION; DECISION MAKING; GROUP TECHNOLOGY; MATHEMATICAL MODELS; PLANT MANAGEMENT; SEMICONDUCTOR DEVICE MANUFACTURE;

CAPACITY ANALYSIS; GROUP SCREENING DESIGN;

COMPUTER AIDED DESIGN;

EID: 0033307340     PISSN: 02750708     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/324138.324449     Document Type: Conference Paper

References (14)