Device reliability in analog CMOS applications

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1999, Pages 81-84

  Thewes, Roland ^a   Brederlow, Ralf ^a   Schluender, Christian ^a   Wieczorek, Peter ^a   Hesener, Alfred ^a   Ankele, Benno ^a   Klein, Peter ^a   Kessel, Sylvia ^a   Weber, Werner ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC BREAKDOWN; EQUIVALENT CIRCUITS; HOT CARRIERS; OPERATIONAL AMPLIFIERS; RELIABILITY; THERMAL STRESS; THRESHOLD VOLTAGE;

ANALOG CMOS APPLICATIONS; BIAS TEMPERATURE INSTABILITIES; CHANNEL HOT CARRIER STRESS; CIRCUIT ACTIVE MODE; CIRCUIT POWER DOWN MODE;

MOSFET DEVICES;

EID: 0033307320     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (31)