Low contact resistance of 30 nm and 200 nm diameter Bi wire array composites

International Conference on Thermoelectrics, ICT, Proceedings

Volumn , Issue , 1999, Pages 558-561

  Huber, T E ^a   Graf, M J ^a   Foss Jr , C A ^a  

^a HOWARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CONTACTS; MAGNETIC VARIABLES MEASUREMENT; MAGNETORESISTANCE; NANOSTRUCTURED MATERIALS; POROUS MATERIALS; SEMICONDUCTING BISMUTH COMPOUNDS;

ANODIC ALUMINA;

SEMICONDUCTOR QUANTUM WIRES;

EID: 0033300713     PISSN: 10942734     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)