FIM and 3D atom probe analysis of Cu/Nb nanocomposite wires

Nanostructured Materials

Volumn 11, Issue 8, 1999, Pages 1031-1039

  Sauvage, X ^a   Thilly, L ^a,b   Lecouturier, F ^c   Guillet, A ^a   Blavette, D ^a  

^a Site Universitaire Du Madrillet   (France)

^b CNRS   (France)

^c Centre de Recherche Sur Les Substances Naturelles   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DIFFUSION IN SOLIDS; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; NIOBIUM; TEXTURES;

DISORIENTATION; FIELD ION MICROSCOPY; NANOCOMPOSITE WIRES; STRESS INDUCED DIFFUSION; THREE DIMENSIONAL ATOM PROBE;

WIRE;

EID: 0033300099     PISSN: 09659773     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0965-9773(99)00386-4     Document Type: Article

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