Reverse recovery failure modes in modern fast recovery diodes

2000 22nd International Conference on Microelectronics, MIEL 2000 - Proceedings

Volumn 2, Issue , 1999, Pages 659-662

  Rahimo, M T ^a   Shammas, N Y A ^a  

^a STAFFORDSHIRE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COMPUTER SIMULATION; ELECTRIC BREAKDOWN; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; NUMERICAL METHODS; POWER ELECTRONICS; SILICON;

CARRIER GRADIENT; DYNAMIC AVALANCHING; FAST RECOVERY DIODES; REVERSE RECOVERY FAILURE MODES; SNAPPY RECOVERY;

AVALANCHE DIODES;

EID: 0033299881     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/icmel.2000.838776     Document Type: Conference Paper

References (7)