Layered (IV-VI)-(V-VI)-materials for low dimensional thermoelectric structures

International Conference on Thermoelectrics, ICT, Proceedings

Volumn , Issue , 1999, Pages 704-708

  Nurnus, J ^a   Boettner, H ^a   Beyer, H ^a   Lambrecht, A ^a  

^a FRAUNHOFER INSTITUTE FOR PHYSICAL MEASUREMENT TECHNIQUES IPM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; CRYSTAL LATTICES; FILM GROWTH; MOLECULAR BEAM EPITAXY; PHASE DIAGRAMS; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING BISMUTH COMPOUNDS; SEMICONDUCTING LEAD COMPOUNDS;

BARIUM FLUORIDE; BISMUTH TELLURIDE; LEAD TELLURIDE;

SEMICONDUCTING FILMS;

EID: 0033299514     PISSN: 10942734     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)