Integrated images give a clearer chemical picture

Materials World

Volumn 7, Issue 10, 1999, Pages 613-615

  Havrilla, George J ^a   Schoonover, Jon R ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; FLUORESCENCE; INFRARED SPECTROSCOPY; RAMAN SPECTROSCOPY; X RAY SPECTROSCOPY;

MICRO-INFRARED SPECTROSCOPY; MICRO-RAMAN SPECTROSCOPY;

CHEMICAL ANALYSIS;

EID: 0033299380     PISSN: 09678638     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)