A new method to characterize TCO/P contact resistance in a-SI solar cells

Materials Research Society Symposium - Proceedings

Volumn 557, Issue , 1999, Pages 737-742

  Hegedus, Steven S ^a   Gibson, Michael ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; DEPOSITION; ELECTRIC RESISTANCE; OHMIC CONTACTS; SEMICONDUCTING TIN COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SUBSTRATES;

CONTACT RESISTANCE; SHEET RESISTANCE; SUPERSTRATE DEVICES; TRANSPARENT CONDUCTIVE OXIDES;

SOLAR CELLS;

EID: 0033298971     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-557-737     Document Type: Article

References (10)

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