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Volumn , Issue , 1999, Pages 455-463
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Transmission electron microscopy characterization of nanocrystalline copper
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CONDENSATION;
CRYSTAL LATTICES;
CRYSTAL MICROSTRUCTURE;
GRAIN BOUNDARIES;
INERT GASES;
NANOSTRUCTURED MATERIALS;
PARTICLES (PARTICULATE MATTER);
POROSITY;
POWDER METALS;
TRANSMISSION ELECTRON MICROSCOPY;
TWINNING;
COINCIDENCE SITE LATTICE (CSL) ORIENTATIONS;
COPPER;
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EID: 0033298281
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (9)
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References (19)
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