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Volumn 32, Issue 5, 1999, Pages 419-435

Reflectance measurements of aluminium surfaces using integrating spheres

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; LIGHT ABSORPTION; LIGHT MEASUREMENT; LIGHT SCATTERING; ROLLING; SILICON SENSORS; SURFACE MEASUREMENT; SURFACES;

EID: 0033297771     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(00)00010-5     Document Type: Article
Times cited : (34)

References (17)
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    • Anomalies in integrating sphere measurements on structured samples
    • Roos A., Ribbing C.G., Bergkvist M. Anomalies in integrating sphere measurements on structured samples. Appl Opt. 27(18):1988;3828-3832.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.