Capacitance spectroscopy of defects in a-SI:H/c-SI heterostructures

Materials Research Society Symposium - Proceedings

Volumn 557, Issue , 1999, Pages 463-468

  Rosch M ^a   Unold, T ^a   Pointmayer, R ^a   Bauer, G H ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; DIODES; HETEROJUNCTIONS;

CAPACITANCE SPECTROSCOPY; FREQUENCY DEPENDENT CAPACITANCE MEASUREMENT; TEMPERATURE DEPENDENT CAPACITANCE MEASUREMENT; WAVER SURFACE TREATMENTS;

AMORPHOUS SILICON;

EID: 0033297473     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-557-463     Document Type: Article

References (9)

1. T. Sawada, N. Terada, S. Tsuge, T. Baba, T. Takahama, K. Wakisaka, S. Tsuga, S. Nakano: Proc. of thé Ist World Conf. On Photovoltaic Energy Conversion (IEEE, Piscataway, 1994), p. 1219
2. B. Jagannathan, W.A. Anderson, Solar Energy Materials and Solar Cells 44, p.165- 176 (1996)
3. M.Tanaka, M. Taguchi, T. Matsuyama, T. Sawada, S. Tsuda, S. Nakano, H. Hanafusa, Y. Kuwano, Jpn. J. Appl. Phys. 31, p. 3518-3522, (1992)
4. D. Caputo, G. de Cesare, A. Nascetti, F. Palma, R. De Rosa, M. Tucci, Proc. of the 2nd World Conf. On Photovoltaic Energy Conversion (Vienna,1998), in press
5. B. Jagannathan, W.A. Anderson, J.Appl. Phys. 82, p. 1930 ( 1997 )
6. J.M. Essick, J.D. Cohen, Appl. Phys. Lett. 55, p. 1232-1234 (1989)
7. R. Brüggemann, Solid State Phenomena 44-46, Part 1, p.505 (1995)
8. R. Brüggemann, C. Main, G.H. Bauer, MRS Symposium Proceedings 258 (MRS, Pittsburg), p. 729 (1992)
9. H.Matsuura, T. Okuno, H. Okushi, K. Tanaka, J.Appl. Phys. 55, p. 10121019(1984)