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Volumn 23, Issue 1, 1999, Pages 229-257

Influence of conditions of r.f. sputtering on chemical constitution and structure of PZT-type thin films

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CERAMIC MATERIALS; DEPOSITION; HOT PRESSING; LEAD COMPOUNDS; METALLOGRAPHIC MICROSTRUCTURE; PEROVSKITE; POLYCRYSTALLINE MATERIALS; SPUTTERING; STOICHIOMETRY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0033296293     PISSN: 10584587     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1080/10584589908210152     Document Type: Article
Times cited : (7)

References (45)
  • 41
    • 85037796886 scopus 로고
    • Powder diffraction, file: Published by The International Centre for Diffraction Dates. Pennsylvania (USA), file N 26-142
    • Powder diffraction, file: (1985). Inorganic phazes. Published by The International Centre for Diffraction Dates. Pennsylvania (USA), file N 26-142.
    • (1985) Inorganic Phazes


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.