Air-coupled nondestructive evaluation using micromachined ultrasonic transducers

Proceedings of the IEEE Ultrasonics Symposium

Volumn 2, Issue , 1999, Pages 1037-1040

  Hansen, Sean T ^a   Mossawir, Benjamin J ^a   Ergun, A Sanli ^a   Degertekin, F Levent ^a   Khuri Yakub, Butrus T ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; EQUIVALENT CIRCUITS; INSERTION LOSSES; NONDESTRUCTIVE EXAMINATION; SIGNAL TO NOISE RATIO; ULTRASONIC TRANSMISSION;

CAPACITIVE MICROMACHINED ULTRASONIC TRANSDUCERS; LAMB WAVE;

ULTRASONIC TRANSDUCERS;

EID: 0033294872     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)