Annealing effects on the internal bias field in ferroelectric PZT thin films with self-polarization

Integrated Ferroelectrics

Volumn 23, Issue 1, 1999, Pages 25-43

  Sun, Shan ^a,c   Wang, Yongmei ^a,d   Fuierer, Paul A ^a   Tuttle, Bruce A ^b  

^a NEW MEXICO INSTITUTE OF MINING AND TECHNOLOGY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c Ramtron International Corporation   (United States)

^d FLEXTRONICS INTERNATIONAL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; ANNEALING; ELECTROMAGNETIC WAVE POLARIZATION; LEAD COMPOUNDS; MAGNETIC HYSTERESIS; MATHEMATICAL MODELS; REMANENCE; SOL-GELS; THERMAL EFFECTS; THIN FILMS;

ASSYMMETRIC SWITCHING PROPERTIES; CHARGE TRAPPING; FERROELECTRIC LEAD ZIRCONIUM TITANATE THIN FILMS; HYSTERESIS ASYMMETRY; INTERNAL BIAS FIELD; SELF POLARIZATION;

FERROELECTRIC MATERIALS;

EID: 0033294758     PISSN: 10584587     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1080/10584589908210138     Document Type: Article

References (15)

1. Sun, S., Liu, L. and Fuierer, P. A. (1994). Ferroelectrics, 152, 187.
2. Takayama, R. and Tomita, Y. (1991). Ferroelectrics, 118, 325.
3. Ogawa, T., Senda, A. and Kasanami, T. (1991). Jap. J. Appl. Phys., 30(9B), 2145.
4. Pike, G. E., Warren, W. L., Dimos, D., Tuttle, B. A., Ramesh, R., Lee, J., Keramidas, V. G. and Evans, J. T. Jr. (1995). Appl. Phys. Lett., 66, 484.
5. Sviridov, E., Sem, I., Alyoshin, V., Biryukov, S. and Dudkevich, V. (1995). In: Ferroelectric Thin Films IV, Mat. Res. Soc. Symp. Proc., 361, 141.
6. Chen, X., Kingon, A. I., Al-Shreef, H. and Bellur, K. R. (1994). Ferroelectrics, 151, 133.
7. Dimos, D., Warren, W. L., Sinclair, M. B., Tuttle, B. A. and Schwartz, R. W. (1994). J. Appl. Phys., 76, 4305.
8. Warren, W. L., Dimos, D., Tuttle, B. A., Nasby, R. D. and Pike, G. E. (1994). J. Appl. Phys. Lett., 65, 1018.
9. Warren, W. L., Al-Shareef, H. N., Dimos, D., Tuttle, B. A. and Pike, G. E. (1996). Appl. Phys. Lett., 68, 1681.
10. Lee, E. G., Wouters, D. J., Willems, G. and Maes, H. E. (1996). Appl. Phys. Lett., 69, 1223.
11. Schwartz, R. W., Assink, R. A. and Headley, T. J. (1992). In: Ferroelectric Thin Films II, Mat. Res. Soc. Symp. Proc., 243, 245.
12. Tuttle, B. A., Schwartz, R. W., Doughty, D. H. and Voigt, J. A. (1990). In: Ferroelectric Thin Films, Mat. Res. Soc. Symp. Proc., 200, 159.
13. Tuttle, B. A., Voigt, J. A. and Goodnow, D. C. (1993). J. Am. Ceram. Soc., 76(6), 1537.
14. Schulze, W. A. and Ogino, K. (1988). Ferroelectrics, 87, 361.
15. Pan, W., Sun, S. and Fuierer, P. A. (1993). J. Appl. Phys., 74(2), 1256.