Techniques to determine the complex material constants of spherical and cylindrical ring resonators

Proceedings of the IEEE Ultrasonics Symposium

Volumn 2, Issue , 1999, Pages 987-990

  Tasker, Ron ^a   Lukacs, Marc ^a   Sayer, Mike ^a   Sherrit, Stewart ^a  

^a TASI Technical Software   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC IMPEDANCE; DIELECTRIC LOSSES; FREQUENCIES; PIEZOELECTRICITY; REGRESSION ANALYSIS; RESONATORS; SPECTRUM ANALYSIS; WHITE NOISE;

COMPLEX MATERIAL CONSTANTS; CYLINDRICAL RING RESONATOR; NONLINEAR REGRESSION TECHNIQUE; PIEZOELECTRIC LOSSES; SPHERICAL RING RESONATOR; THICKNESS POLED RING RESONATORS;

PIEZOELECTRIC DEVICES;

EID: 0033293848     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)