Full chemical fabrication of SrBi2(Ta,Nb)2O9 ferroelectric thin film capacitors

Integrated Ferroelectrics

Volumn 23, Issue 1, 1999, Pages 77-88

  Yi, J H ^a   Thomas, P ^a   Manier, M ^a   Mercurio, J P ^a  

^a UNIVERSITY OF LIMOGES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CERAMIC CAPACITORS; COATING TECHNIQUES; ELECTRIC VARIABLES MEASUREMENT; FILM PREPARATION; MAGNETIC HYSTERESIS; SCANNING ELECTRON MICROSCOPY; STRONTIUM COMPOUNDS; THIN FILM DEVICES; X RAY DIFFRACTION ANALYSIS;

FULL CHEMICAL FABRICATION; HYSTERESIS LOOPS; RUTHENIUM DIOXIDE ELECTRODES; SPIN COATING; STRONTIUM BISMUTH NIOBATE; STRONTIUM BISMUTH TANTALATE;

FERROELECTRIC DEVICES;

EID: 0033293084     PISSN: 10584587     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1080/10584589908210141     Document Type: Article

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