Utilizing scatter for pixel subspace selection

Proceedings of the IEEE International Conference on Computer Vision

Volumn 2, Issue , 1999, Pages 1111-1116

  Schweitzer, Haim ^a  

^a UNIVERSITY OF TEXAS AT DALLAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; OPTIMIZATION; STATISTICAL METHODS;

FEATURE SUBSPACES; SCATTER MEASURES;

PATTERN RECOGNITION;

EID: 0033284853     PISSN: 15505499     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iccv.1999.790404     Document Type: Conference Paper

References (14)