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Volumn 19, Issue 6, 1999, Pages 435-443
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Determination of adsorption isotherms by XPS and ToF-SIMS: Their role in adhesion science
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Author keywords
[No Author keywords available]
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Indexed keywords
ACIDITY;
ADSORPTION ISOTHERMS;
CHEMICAL BONDS;
INTERFACES (MATERIALS);
MACROMOLECULES;
SECONDARY ION MASS SPECTROMETRY;
SUBSTRATES;
X RAY PHOTOELECTRON SPECTROSCOPY;
INTERACTION ENERGY;
ORGANOSILANE ADHESION PROMOTERS;
ADHESION;
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EID: 0033284678
PISSN: 01437496
EISSN: None
Source Type: Journal
DOI: 10.1016/S0143-7496(98)00068-2 Document Type: Article |
Times cited : (24)
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References (15)
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