Can failure analysis keep pace with IC technology development?

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 1999, Pages 9-14

  Boit, Christian ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; INTEGRATED CIRCUIT MANUFACTURE;

INTEGRATED CIRCUIT TECHNOLOGY;

INTEGRATED CIRCUIT TESTING;

EID: 0033284316     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ipfa.1999.791220     Document Type: Conference Paper

References (5)