Modeling Bayesian estimation for deformable contours

Proceedings of the IEEE International Conference on Computer Vision

Volumn 2, Issue , 1999, Pages 991-996

  Li, Stan Z ^a   Lu, Juwei ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; EIGENVALUES AND EIGENFUNCTIONS; MATHEMATICAL MODELS; SURFACES;

BAYESIAN ESTIMATION; DEFORMABLE CONTOURS;

IMAGE ANALYSIS;

EID: 0033283981     PISSN: 15505499     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)