Optimization of experimental conditions for variable angle spectroscopic ellipsometry analysis. Application to GaAs/(Al,Ga)As quantum well characterization

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 66, Issue 1, 1999, Pages 88-91

  Colard, Stéphane ^a   Mihailovic, Martine ^a  

^a UNIVERSITÉ BLAISE PASCAL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; OPTIMIZATION; PHOTOLUMINESCENCE; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SPECTROSCOPIC ANALYSIS;

VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0033283665     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(99)00135-X     Document Type: Article

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