Temperature gradient effects in electromigration using an extended transition probability model and temperature gradient free tests. Part 1: Transition probability model

International Integrated Reliability Workshop Final Report

Volumn , Issue , 1999, Pages 24-35

  Jonggook, Kim ^a   Tyree, Vance C ^a   Crowell, C R ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; DIFFUSION; MATHEMATICAL MODELS; PROBABILITY; THERMAL EFFECTS;

EXTENDED TRANSITION PROBABILITY MODELS; TEMPERATURE GRADIENT EFFECTS; TEMPERATURE GRADIENT FREE TESTS;

ELECTROMIGRATION;

EID: 0033282883     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (27)