Investigation on the analysis software for switching characteristics of large capacity GTO

IECON Proceedings (Industrial Electronics Conference)

Volumn 2, Issue , 1999, Pages 646-651

  Li, Qingmin ^a   Huang, Yulong ^a   Xu, Guozheng ^a   Qian, Jiali ^a   Azuma, Satoshi ^a   Kimata, Masahiro ^a   Seto, Makoto ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BACKPROPAGATION; COMPUTER SOFTWARE; ELECTRIC LOSSES; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK PARAMETERS; HEAT TRANSFER; LEARNING ALGORITHMS; NEURAL NETWORKS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR SWITCHES;

LARGE CAPACITY GATE TUNE-OFF (GTO) DEVICES;

THYRISTORS;

EID: 0033282554     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)